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Terrestrial radiation effects in ULSI devices and electronic systems /

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Detalles Bibliográficos
Autor Principal:	Ibe, Eishi H. (Author)
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Singapore : IEEE : Wiley, 2015.
Subjects:	Electronic circuits > Effect of radiation on. Integrated circuits > Ultra large scale integration > Reliability. Integrated circuits > Effect of radiation on. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

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