Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Detalhes bibliográficos
Main Authors:	Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Assuntos:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
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Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Por Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moises

Publicado em 2014

An electronic book accessible through the World Wide Web; click to view

Recurso Electrónico livro electrónico