Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Xehetasun bibliografikoak
Egile Nagusiak:	Servín, Manuel (Egilea), Quiroga, J. Antonio (Egilea), Padilla, J. Moises (Egilea)
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Gaiak:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Fringe pattern analysis for optical metrology : theory, algorithms, and applications / nork Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moises

Argitaratua 2014

An electronic book accessible through the World Wide Web; click to view

Baliabide elektronikoa eBook