Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
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Main Authors: | Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author) |
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格式: | 电子 电子书 |
语言: | 英语 |
出版: |
Weinheim, Germany :
Wiley-VCH Verlag GmbH & Co. KGaA,
2014.
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在线阅读: | An electronic book accessible through the World Wide Web; click to view |
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