Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
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Главные авторы: | Servín, Manuel (Автор), Quiroga, J. Antonio (Автор), Padilla, J. Moises (Автор) |
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Формат: | Электронный ресурс eКнига |
Язык: | английский |
Опубликовано: |
Weinheim, Germany :
Wiley-VCH Verlag GmbH & Co. KGaA,
2014.
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Online-ссылка: | An electronic book accessible through the World Wide Web; click to view |
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