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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Detalhes bibliográficos
Principais autores:	Servín, Manuel (Autor), Quiroga, J. Antonio (Autor), Padilla, J. Moises (Autor)
Formato:	Recurso Eletrônico livro eletrônico
Idioma:	inglês
Publicado em:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Assuntos:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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