Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
Zapisane w:
Główni autorzy: | Servín, Manuel (Autor), Quiroga, J. Antonio (Autor), Padilla, J. Moises (Autor) |
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Format: | Elektroniczne E-book |
Język: | angielski |
Wydane: |
Weinheim, Germany :
Wiley-VCH Verlag GmbH & Co. KGaA,
2014.
|
Hasła przedmiotowe: | |
Dostęp online: | An electronic book accessible through the World Wide Web; click to view |
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