Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
保存先:
主要な著者: | Servín, Manuel (著者), Quiroga, J. Antonio (著者), Padilla, J. Moises (著者) |
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フォーマット: | 電子媒体 eBook |
言語: | 英語 |
出版事項: |
Weinheim, Germany :
Wiley-VCH Verlag GmbH & Co. KGaA,
2014.
|
主題: | |
オンライン・アクセス: | An electronic book accessible through the World Wide Web; click to view |
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