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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Detalles Bibliográficos
Main Authors:	Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, J. Moises (Author)
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Subjects:	Diffraction patterns > Data processing. Image processing > Data processing. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
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