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Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

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Detalhes bibliográficos
Outros Autores:	Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Formato:	Recurso Eletrônico livro eletrônico
Idioma:	inglês
Publicado em:	New Jersey : World Scientific, [2014]
Assuntos:	Reliability (Engineering) Stochastic systems. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
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