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Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

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Detalles Bibliográficos
Otros Autores:	Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Formato:	Electrónico eBook
Lenguaje:	inglés
Publicado:	New Jersey : World Scientific, [2014]
Materias:	Reliability (Engineering) Stochastic systems. Electronic books.
Acceso en línea:	An electronic book accessible through the World Wide Web; click to view
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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