Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

Sábháilte in:
Sonraí bibleagrafaíochta
Rannpháirtithe: Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: New Jersey : World Scientific, [2014]
Ábhair:
Rochtain ar líne:An electronic book accessible through the World Wide Web; click to view
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
Cur síos
Cur síos fisiciúil:1 online resource (379 pages) : illustrations
Leabharliosta:Includes bibliographical references.
ISBN:9789814571944 (e-book)