Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine /

Geahča maid

• Semiconductor strain metrology principles and applications /
  Dahkki: Wong, Terence K. S.
  Almmustuhtton: (2012)
• SOI lubistors : lateral, unidirectional, bipolar-type insulated-gate transistors /
  Dahkki: Omura, Y. (Yasuhisa)
  Almmustuhtton: (2013)
• SiC materials and devices.
  Almmustuhtton: (2006)
• Silicon science and advanced micro-device engineering II selected, peer reviewed papers from the 6th International Symposium on Silicon Science and 2nd International Conference on Advanced Micro-Device Engineering (ISSS&AMDE 2010), December 9-10, 2010, Kiryu City Performing Arts Center, Kiryu, Japan /
  Almmustuhtton: (2012)
• Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan /
  Almmustuhtton: (2011)