Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine /
Αποθηκεύτηκε σε:
| Συγγραφή απο Οργανισμό/Αρχή: | International Workshop on Semiconductor-on-Insulator Materials and Devices Kiev, Ukraine |
|---|---|
| Άλλοι συγγραφείς: | Nazarov, A. N. (Alexei N.), Raskin, J.-P. (Jean-Pierre), 1971- |
| Μορφή: | Ηλεκτρονική πηγή Πρακτικό Συνεδρίου Ηλ. βιβλίο |
| Γλώσσα: | Αγγλικά |
| Έκδοση: |
Durnten-Zurich, Switzerland :
Trans Tech Publications,
[2011]
|
| Σειρά: | Advanced materials research ;
276. |
| Θέματα: | |
| Διαθέσιμο Online: | An electronic book accessible through the World Wide Web; click to view |
| Ετικέτες: |
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Παρόμοια τεκμήρια
-
Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine /
Έκδοση: (2011) -
Semiconductor strain metrology principles and applications /
από: Wong, Terence K. S.
Έκδοση: (2012) -
Semiconductor strain metrology principles and applications /
από: Wong, Terence K. S.
Έκδοση: (2012) -
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από: Omura, Y. (Yasuhisa)
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SOI lubistors : lateral, unidirectional, bipolar-type insulated-gate transistors /
από: Omura, Y. (Yasuhisa)
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