Defects and diffusion, theory and simulation : an annual retrospective II /

Defects and diffusion in semiconductors. an annual retrospective /
Опубліковано: (2008)

Defects and diffusion in semiconductors.
Опубліковано: (2013)

Defects and diffusion in semiconductors.
Опубліковано: (2013)

Defects and diffusion in semiconductors XIII /
Опубліковано: (2011)

Defects and diffusion in semiconductors XIII /
Опубліковано: (2011)

Electron paramagnetic resonance studies of point defects in AlGaN and SiC /
за авторством: Trinh, Xuan Thang
Опубліковано: (2015)

Electron paramagnetic resonance studies of point defects in AlGaN and SiC /
за авторством: Trinh, Xuan Thang
Опубліковано: (2015)

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Опубліковано: (2012)

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Опубліковано: (2012)

Diffusion in semiconductors, other than silicon : compilation /
Опубліковано: (2010)

Diffusion in semiconductors, other than silicon : compilation /
Опубліковано: (2010)

Radiation defect engineering
за авторством: Kozlovskiĭ, V. V. (Vitaliĭ Vasilʹevich)
Опубліковано: (2005)

Radiation defect engineering
за авторством: Kozlovskiĭ, V. V. (Vitaliĭ Vasilʹevich)
Опубліковано: (2005)

Defects and diffusion, theory and simulation : an annual retrospective III /
Опубліковано: (2012)

Defects and diffusion, theory and simulation : an annual retrospective III /
Опубліковано: (2012)

Defects and diffusion in metals : an annual retrospective XI /
Опубліковано: (2009)

Defects and diffusion in metals : an annual retrospective X /
Опубліковано: (2008)

Defects and diffusion in metals : an annual retrospective IX /
Опубліковано: (2007)

Defects and diffusion in metals : an annual retrospective XI /
Опубліковано: (2009)

Defects and diffusion in metals : an annual retrospective X /
Опубліковано: (2008)

Defects and diffusion in metals : an annual retrospective IX /
Опубліковано: (2007)

Functionalization of semiconductor surfaces
Опубліковано: (2012)

Functionalization of semiconductor surfaces
Опубліковано: (2012)

On the perspectives of wide-band gap power devices in electronic-based power conversion for renewable systems
за авторством: Araujo, Samuel Vasconcelos
Опубліковано: (2013)

On the perspectives of wide-band gap power devices in electronic-based power conversion for renewable systems
за авторством: Araujo, Samuel Vasconcelos
Опубліковано: (2013)

Semiconductor physics and devices : basic principles /
за авторством: Neamen, Donald A.
Опубліковано: (2003)

Semiconductor physics and devices : basic principles /
за авторством: Neamen, Donald A.
Опубліковано: (2012)

Semiconductor physics and devices : basic principles /
за авторством: Neamen, Donald A.
Опубліковано: (2003)

Semiconductor physics and devices : basic principles /
за авторством: Neamen, Donald A.
Опубліковано: (2003)

Semiconductor physics and devices : basic principles /
за авторством: Neamen, Donald A.
Опубліковано: (2003)

Semiconductor physics and devices : basic principles /
за авторством: Neamen, Donald A.
Опубліковано: (2012)

Reliability and radiation effects in compound semiconductors
за авторством: Johnston, Allan
Опубліковано: (2010)

Reliability and radiation effects in compound semiconductors
за авторством: Johnston, Allan
Опубліковано: (2010)

Diffusion and defects in TiO2 : a compilation /
Опубліковано: (2013)

Diffusion and defects in TiO2 : a compilation /
Опубліковано: (2013)

Advanced semiconductor heterostructures novel devices, potential device applications and basic properties /
Опубліковано: (2003)