Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
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企業作者: | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan |
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其他作者: | Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science) |
格式: | 電子 Conference Proceeding 電子書 |
語言: | 英语 |
出版: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
叢編: | Materials science forum ;
v. 725. |
主題: | |
在線閱讀: | An electronic book accessible through the World Wide Web; click to view |
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