Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
-д хадгалсан:
Байгууллагын зохиогч: | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan |
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Бусад зохиолчид: | Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science) |
Формат: | Цахим Бага хурлын үйл явц Цахим ном |
Хэл сонгох: | англи |
Хэвлэсэн: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
Цуврал: | Materials science forum ;
v. 725. |
Нөхцлүүд: | |
Онлайн хандалт: | An electronic book accessible through the World Wide Web; click to view |
Шошгууд: |
Шошго нэмэх
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
|
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