Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
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Corporate Author: | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan |
---|---|
Other Authors: | Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science) |
Format: | Electronic Conference Proceeding eBook |
Language: | English |
Published: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
Series: | Materials science forum ;
v. 725. |
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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