International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan, Yamada-Kaneta, H., & Sakai, A. (2012). Defects-recognition, imaging and physics in semiconductors XIV: Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan. Trans Tech Publications.
Чикаго-гийн эшлэл (17 дахь хэвлэлт)International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan, Hiroshi Yamada-Kaneta, ба Akira Sakai. Defects-recognition, Imaging and Physics in Semiconductors XIV: Selected, Peer Reviewed Papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan. Durnten-Zurich ; Enfield, NH: Trans Tech Publications, 2012.
MLA -ийн эшлэл (9 дэх хэвлэлт)International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan, et al. Defects-recognition, Imaging and Physics in Semiconductors XIV: Selected, Peer Reviewed Papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan. Trans Tech Publications, 2012.