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Nanobeam x-ray scattering : probing matter at the nanoscale /

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Detalhes bibliográficos
Autor principal:	Stangl, Julian
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	Hoboken, New Jersey : John Wiley & sons, 2013.
Assuntos:	Electron probe microanalysis. Nanotechnology. X-rays > Scattering. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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