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Nanobeam x-ray scattering : probing matter at the nanoscale /

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Detalles Bibliográficos
Autor Principal:	Stangl, Julian
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Hoboken, New Jersey : John Wiley & sons, 2013.
Subjects:	Electron probe microanalysis. Nanotechnology. X-rays > Scattering. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

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