Electrical overstress (EOS) devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
I tiakina i:
Kaituhi matua: | Voldman, Steven H. |
---|---|
Kaituhi rangatōpū: | ebrary, Inc |
Hōputu: | Tāhiko īPukapuka |
Reo: | Ingarihi |
I whakaputaina: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
|
Rangatū: | ESD series
|
Ngā marau: | |
Urunga tuihono: | An electronic book accessible through the World Wide Web; click to view |
Ngā Tūtohu: |
Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|
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