Electrical overstress (EOS) devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
Guardat en:
| Autor principal: | |
|---|---|
| Autor corporatiu: | |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
|
| Col·lecció: | ESD series
|
| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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