Transmission electron microscopy in micro-nanoelectronics
I tiakina i:
Kaituhi rangatōpū: | ebrary, Inc |
---|---|
Ētahi atu kaituhi: | Claverie, A. (Alain) |
Hōputu: | Tāhiko īPukapuka |
Reo: | Ingarihi |
I whakaputaina: |
Hoboken, N.J. : London :
John Wiley &Sons, Inc., ; ISTE,
2013.
|
Rangatū: | Nanoscience and nanotechnology series
|
Ngā marau: | |
Urunga tuihono: | An electronic book accessible through the World Wide Web; click to view |
Ngā Tūtohu: |
Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|
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Ngā tūemi rite
-
Aberration-corrected analytical transmission electron microscopy
I whakaputaina: (2011) -
High-resolution electron microscopy
mā: Spence, John C. H.
I whakaputaina: (2009) -
Scanning probe microscopy
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mā: Goodhew, Peter J.
I whakaputaina: (2001) -
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I whakaputaina: (1999)