Transmission electron microscopy in micro-nanoelectronics
में बचाया:
निगमित लेखक: | ebrary, Inc |
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अन्य लेखक: | Claverie, A. (Alain) |
स्वरूप: | इलेक्ट्रोनिक ई-पुस्तक |
भाषा: | अंग्रेज़ी |
प्रकाशित: |
Hoboken, N.J. : London :
John Wiley &Sons, Inc., ; ISTE,
2013.
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श्रृंखला: | Nanoscience and nanotechnology series
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विषय: | |
ऑनलाइन पहुंच: | An electronic book accessible through the World Wide Web; click to view |
टैग: |
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समान संसाधन
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Aberration-corrected analytical transmission electron microscopy
प्रकाशित: (2011) -
Scanning probe microscopy
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High-resolution electron microscopy
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