Transmission electron microscopy in micro-nanoelectronics
Sábháilte in:
Údar corparáideach: | ebrary, Inc |
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Rannpháirtithe: | Claverie, A. (Alain) |
Formáid: | Leictreonach Ríomhleabhar |
Teanga: | Béarla |
Foilsithe / Cruthaithe: |
Hoboken, N.J. : London :
John Wiley &Sons, Inc., ; ISTE,
2013.
|
Sraith: | Nanoscience and nanotechnology series
|
Ábhair: | |
Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
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Míreanna comhchosúla
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Aberration-corrected analytical transmission electron microscopy
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