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Semiconductor strain metrology principles and applications /

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Detalles Bibliográficos
Autor principal:	Wong, Terence K. S.
Autor Corporativo:	ebrary, Inc
Formato:	Electrónico eBook
Lenguaje:	inglés
Publicado:	[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Materias:	Semiconductors > Design and construction > Materials. Compound semiconductors > Design and construction > Materials. Silicon-on-insulator technology. Electronic books.
Acceso en línea:	An electronic book accessible through the World Wide Web; click to view
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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