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Semiconductor strain metrology principles and applications /

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Detalhes bibliográficos
Autor principal:	Wong, Terence K. S.
Autor Corporativo:	ebrary, Inc
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Assuntos:	Semiconductors > Design and construction > Materials. Compound semiconductors > Design and construction > Materials. Silicon-on-insulator technology. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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