Semiconductor strain metrology principles and applications /
में बचाया:
मुख्य लेखक: | Wong, Terence K. S. |
---|---|
निगमित लेखक: | ebrary, Inc |
स्वरूप: | इलेक्ट्रोनिक ई-पुस्तक |
भाषा: | अंग्रेज़ी |
प्रकाशित: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
विषय: | |
ऑनलाइन पहुंच: | An electronic book accessible through the World Wide Web; click to view |
टैग: |
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समान संसाधन
-
Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine /
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