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Semiconductor strain metrology principles and applications /

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Détails bibliographiques
Auteur principal:	Wong, Terence K. S.
Collectivité auteur:	ebrary, Inc
Format:	Électronique eBook
Langue:	anglais
Publié:	[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Sujets:	Semiconductors > Design and construction > Materials. Compound semiconductors > Design and construction > Materials. Silicon-on-insulator technology. Electronic books.
Accès en ligne:	An electronic book accessible through the World Wide Web; click to view
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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