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Semiconductor strain metrology principles and applications /

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Podrobná bibliografie
Hlavní autor:	Wong, Terence K. S.
Korporativní autor:	ebrary, Inc
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Témata:	Semiconductors > Design and construction > Materials. Compound semiconductors > Design and construction > Materials. Silicon-on-insulator technology. Electronic books.
On-line přístup:	An electronic book accessible through the World Wide Web; click to view
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

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