Semiconductor strain metrology principles and applications /
Guardat en:
| Autor principal: | |
|---|---|
| Autor corporatiu: | |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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