Semiconductor strain metrology principles and applications /
Gorde:
Egile nagusia: | Wong, Terence K. S. |
---|---|
Erakunde egilea: | ebrary, Inc |
Formatua: | Baliabide elektronikoa eBook |
Hizkuntza: | ingelesa |
Argitaratua: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
Gaiak: | |
Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
Etiketak: |
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Antzeko izenburuak
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