Microelectronics failure analysis desk reference /
I tiakina i:
| Kaituhi rangatōpū: | |
|---|---|
| Ētahi atu kaituhi: | |
| Hōputu: | Tāhiko īPukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Putanga: | 6th ed. |
| Ngā marau: | |
| Urunga tuihono: | An electronic book accessible through the World Wide Web; click to view |
| Ngā Tūtohu: |
Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|
Rārangi ihirangi:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.