Microelectronics failure analysis desk reference /
保存先:
| 団体著者: | |
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| その他の著者: | |
| フォーマット: | 電子媒体 eBook |
| 言語: | 英語 |
| 出版事項: |
Materials Park, Ohio :
ASM International,
c2011.
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| 版: | 6th ed. |
| 主題: | |
| オンライン･アクセス: | An electronic book accessible through the World Wide Web; click to view |
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目次:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.