Microelectronics failure analysis desk reference /

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Detalles Bibliográficos
Autor Corporativo: ebrary, Inc
Outros autores: Ross, Richard J.
Formato: Electrónico eBook
Idioma:inglés
Publicado: Materials Park, Ohio : ASM International, c2011.
Edición:6th ed.
Subjects:
Acceso en liña:An electronic book accessible through the World Wide Web; click to view
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Table of Contents:
  • section 1. Introduction
  • section 2. Failure analysis process overviews
  • section 3. Failure analysis topics
  • section 4. Fault verification and classification
  • section 5. Localization techniques
  • section 6. Deprocessing and sample preparation
  • section 7. Inspection
  • section 8. Materials analysis
  • section 9. Focused ion beam applications
  • section 10. Management and reference information.