Microelectronics failure analysis desk reference /
Wedi'i Gadw mewn:
| Awdur Corfforaethol: | |
|---|---|
| Awduron Eraill: | |
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Rhifyn: | 6th ed. |
| Pynciau: | |
| Mynediad Ar-lein: | An electronic book accessible through the World Wide Web; click to view |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
|
Tabl Cynhwysion:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.