Microelectronics failure analysis desk reference /
Guardat en:
| Autor corporatiu: | |
|---|---|
| Altres autors: | |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Materials Park, Ohio :
ASM International,
c2011.
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| Edició: | 6th ed. |
| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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Taula de continguts:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.