Advanced interconnects for ULSI technology
Sábháilte in:
Údar corparáideach: | ebrary, Inc |
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Rannpháirtithe: | Baklanov, Mikhail, Ho, P. S., Zschech, Ehrenfried |
Formáid: | Leictreonach Ríomhleabhar |
Teanga: | Béarla |
Foilsithe / Cruthaithe: |
Chichester, West Susex :
Wiley,
2012.
|
Ábhair: | |
Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
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Míreanna comhchosúla
Electromigration in ULSI interconnections
de réir: Tan, Cher Ming, 1959-
Foilsithe / Cruthaithe: (2010)
de réir: Tan, Cher Ming, 1959-
Foilsithe / Cruthaithe: (2010)
A one-semester course in modeling of VLSI interconnections /
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Foilsithe / Cruthaithe: (2015)
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de réir: Säckinger, Eduard, 1959-
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Míreanna comhchosúla
-
Electromigration in ULSI interconnections
de réir: Tan, Cher Ming, 1959-
Foilsithe / Cruthaithe: (2010) -
A one-semester course in modeling of VLSI interconnections /
de réir: Goel, Ashok K., 1953-
Foilsithe / Cruthaithe: (2015) -
Terrestrial radiation effects in ULSI devices and electronic systems /
de réir: Ibe, Eishi H.
Foilsithe / Cruthaithe: (2015) -
VLSI test principles and architectures design for testability /
Foilsithe / Cruthaithe: (2006) -
Mixed analog-digital VLSI devices and technology
de réir: Tsividis, Yannis
Foilsithe / Cruthaithe: (2002)