Advanced interconnects for ULSI technology
Gorde:
Erakunde egilea: | ebrary, Inc |
---|---|
Beste egile batzuk: | Baklanov, Mikhail, Ho, P. S., Zschech, Ehrenfried |
Formatua: | Baliabide elektronikoa eBook |
Hizkuntza: | ingelesa |
Argitaratua: |
Chichester, West Susex :
Wiley,
2012.
|
Gaiak: | |
Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
Etiketak: |
Etiketa erantsi
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Antzeko izenburuak
-
Electromigration in ULSI interconnections
nork: Tan, Cher Ming, 1959-
Argitaratua: (2010) -
A one-semester course in modeling of VLSI interconnections /
nork: Goel, Ashok K., 1953-
Argitaratua: (2015) -
Terrestrial radiation effects in ULSI devices and electronic systems /
nork: Ibe, Eishi H.
Argitaratua: (2015) -
VLSI test principles and architectures design for testability /
Argitaratua: (2006) -
Mixed analog-digital VLSI devices and technology
nork: Tsividis, Yannis
Argitaratua: (2002)