Нүүр зураг

QR код

Polymers for electricity and electronics materials, properties, and applications /

"This book introduces readers to the fundamentals, basic principles, properties, and applications of electrical polymers. It provides the principles in an extended and accessible way, as well as including examples of state-of-the-art scientific issues. The book evaluates emerging technologies s...

Бүрэн тодорхойлолт

-д хадгалсан:

Номзүйн дэлгэрэнгүй
Үндсэн зохиолч:	Drobny, Jiri George
Байгууллагын зохиогч:	ebrary, Inc
Формат:	Цахим Цахим ном
Хэл сонгох:	англи
Хэвлэсэн:	Hoboken, N.J. : Wiley, 2012.
Нөхцлүүд:	Electronic apparatus and appliances > Materials. Polymers. Electronic books.
Онлайн хандалт:	An electronic book accessible through the World Wide Web; click to view
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!

Ижил төстэй зүйлс

Electronic materials science
-н: Irene, Eugene A.
Хэвлэсэн: (2005)

Electrical characterization of organic electronic materials and devices
-н: Stallinga, Peter, 1966-
Хэвлэсэн: (2009)

Polymers for electronic components a Rapra industry analysis report /
-н: Cousins, Keith
Хэвлэсэн: (2001)

Solid state electronic devices /
-н: Streetman, Ben G.
Хэвлэсэн: (2010)

Single-electron devices and circuits in silicon
-н: Durrani, Zahid Ali Khan
Хэвлэсэн: (2010)

Polymer electronics a flexible technology /
Хэвлэсэн: (2009)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Хэвлэсэн: (2008)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Хэвлэсэн: (2002)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Хэвлэсэн: (2007)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Хэвлэсэн: (2001)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Хэвлэсэн: (1999)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Хэвлэсэн: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Хэвлэсэн: (1997)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Хэвлэсэн: (1998)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Хэвлэсэн: (1996)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Хэвлэсэн: (2004)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Хэвлэсэн: (2003)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Хэвлэсэн: (2010)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Хэвлэсэн: (2009)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Хэвлэсэн: (2011)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Хэвлэсэн: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Хэвлэсэн: (2014)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Хэвлэсэн: (2006)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Хэвлэсэн: (2015)

Electronic components and processes
-н: Maheshwari, Preeti
Хэвлэсэн: (2006)

Guide to state-of-the-art electron devices
Хэвлэсэн: (2013)

Electronic : devices and circuits /
-н: Kulshreshtha, D. c.
Хэвлэсэн: (2006)

Electrical engineering materials
-н: Basak, T. K.
Хэвлэсэн: (2012)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
-н: Karris, Steven T.
Хэвлэсэн: (2012)

ESD circuits and devices /
-н: Voldman, Steven H.
Хэвлэсэн: (2006)

Novel architectures for flexible electrochemical devices and systems
-н: Kawahara, Jun
Хэвлэсэн: (2013)

Electronic devices : a text and software problems manual /
-н: Schultz, Mitchel E.
Хэвлэсэн: (1994)

Digital rubbish natural history of electronics /
-н: Gabrys, Jennifer
Хэвлэсэн: (2011)

Hertzian tales electronic products, aesthetic experience, and critical design /
-н: Dunne, Anthony
Хэвлэсэн: (2005)

Parts selection and management
Хэвлэсэн: (2004)

A designer's guide to built-in self-test
-н: Stroud, Charles E.
Хэвлэсэн: (2002)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Хэвлэсэн: (2012)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Хэвлэсэн: (2000)

Microelectronic failure analysis desk reference : 2001 supplement /
Хэвлэсэн: (2001)

Microelectronic failure analysis desk reference.
Хэвлэсэн: (2002)