Delwedd Flaen

Côd QR

Polymers for electricity and electronics materials, properties, and applications /

"This book introduces readers to the fundamentals, basic principles, properties, and applications of electrical polymers. It provides the principles in an extended and accessible way, as well as including examples of state-of-the-art scientific issues. The book evaluates emerging technologies s...

Disgrifiad llawn

Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awdur:	Drobny, Jiri George
Awdur Corfforaethol:	ebrary, Inc
Fformat:	Electronig eLyfr
Iaith:	Saesneg
Cyhoeddwyd:	Hoboken, N.J. : Wiley, 2012.
Pynciau:	Electronic apparatus and appliances > Materials. Polymers. Electronic books.
Mynediad Ar-lein:	An electronic book accessible through the World Wide Web; click to view
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

Eitemau Tebyg

Electronic materials science
gan: Irene, Eugene A.
Cyhoeddwyd: (2005)

Electrical characterization of organic electronic materials and devices
gan: Stallinga, Peter, 1966-
Cyhoeddwyd: (2009)

Polymers for electronic components a Rapra industry analysis report /
gan: Cousins, Keith
Cyhoeddwyd: (2001)

Solid state electronic devices /
gan: Streetman, Ben G.
Cyhoeddwyd: (2010)

Single-electron devices and circuits in silicon
gan: Durrani, Zahid Ali Khan
Cyhoeddwyd: (2010)

Polymer electronics a flexible technology /
Cyhoeddwyd: (2009)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Cyhoeddwyd: (2008)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Cyhoeddwyd: (2002)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Cyhoeddwyd: (2004)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Cyhoeddwyd: (2003)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2009)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Cyhoeddwyd: (2001)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Cyhoeddwyd: (2010)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2007)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Cyhoeddwyd: (1999)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Cyhoeddwyd: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Cyhoeddwyd: (1997)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Cyhoeddwyd: (1998)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Cyhoeddwyd: (1996)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2011)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Cyhoeddwyd: (2014)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Cyhoeddwyd: (2006)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Cyhoeddwyd: (2015)

Electronic components and processes
gan: Maheshwari, Preeti
Cyhoeddwyd: (2006)

Guide to state-of-the-art electron devices
Cyhoeddwyd: (2013)

Electronic : devices and circuits /
gan: Kulshreshtha, D. c.
Cyhoeddwyd: (2006)

Electrical engineering materials
gan: Basak, T. K.
Cyhoeddwyd: (2012)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
gan: Karris, Steven T.
Cyhoeddwyd: (2012)

ESD circuits and devices /
gan: Voldman, Steven H.
Cyhoeddwyd: (2006)

Novel architectures for flexible electrochemical devices and systems
gan: Kawahara, Jun
Cyhoeddwyd: (2013)

Electronic devices : a text and software problems manual /
gan: Schultz, Mitchel E.
Cyhoeddwyd: (1994)

Digital rubbish natural history of electronics /
gan: Gabrys, Jennifer
Cyhoeddwyd: (2011)

Hertzian tales electronic products, aesthetic experience, and critical design /
gan: Dunne, Anthony
Cyhoeddwyd: (2005)

Parts selection and management
Cyhoeddwyd: (2004)

A designer's guide to built-in self-test
gan: Stroud, Charles E.
Cyhoeddwyd: (2002)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Cyhoeddwyd: (2012)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Cyhoeddwyd: (2000)

Microelectronic failure analysis desk reference : 2001 supplement /
Cyhoeddwyd: (2001)

Microelectronic failure analysis desk reference.
Cyhoeddwyd: (2002)