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Polymers for electricity and electronics materials, properties, and applications /

"This book introduces readers to the fundamentals, basic principles, properties, and applications of electrical polymers. It provides the principles in an extended and accessible way, as well as including examples of state-of-the-art scientific issues. The book evaluates emerging technologies s...

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التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Drobny, Jiri George
مؤلف مشترك:	ebrary, Inc
التنسيق:	الكتروني كتاب الكتروني
اللغة:	الإنجليزية
منشور في:	Hoboken, N.J. : Wiley, 2012.
الموضوعات:	Electronic apparatus and appliances > Materials. Polymers. Electronic books.
الوصول للمادة أونلاين:	An electronic book accessible through the World Wide Web; click to view
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

Electronic materials science
حسب: Irene, Eugene A.
منشور في: (2005)

Electrical characterization of organic electronic materials and devices
حسب: Stallinga, Peter, 1966-
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Polymers for electronic components a Rapra industry analysis report /
حسب: Cousins, Keith
منشور في: (2001)

Solid state electronic devices /
حسب: Streetman, Ben G.
منشور في: (2010)

Single-electron devices and circuits in silicon
حسب: Durrani, Zahid Ali Khan
منشور في: (2010)

Polymer electronics a flexible technology /
منشور في: (2009)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
منشور في: (2008)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
منشور في: (2002)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
منشور في: (2007)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
منشور في: (2001)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
منشور في: (1999)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
منشور في: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
منشور في: (1997)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
منشور في: (1998)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
منشور في: (1996)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
منشور في: (2004)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
منشور في: (2003)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
منشور في: (2010)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
منشور في: (2009)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
منشور في: (2011)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
منشور في: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
منشور في: (2014)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
منشور في: (2006)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
منشور في: (2015)

Electronic components and processes
حسب: Maheshwari, Preeti
منشور في: (2006)

Guide to state-of-the-art electron devices
منشور في: (2013)

Electronic : devices and circuits /
حسب: Kulshreshtha, D. c.
منشور في: (2006)

Electrical engineering materials
حسب: Basak, T. K.
منشور في: (2012)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
حسب: Karris, Steven T.
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ESD circuits and devices /
حسب: Voldman, Steven H.
منشور في: (2006)

Novel architectures for flexible electrochemical devices and systems
حسب: Kawahara, Jun
منشور في: (2013)

Electronic devices : a text and software problems manual /
حسب: Schultz, Mitchel E.
منشور في: (1994)

Digital rubbish natural history of electronics /
حسب: Gabrys, Jennifer
منشور في: (2011)

Hertzian tales electronic products, aesthetic experience, and critical design /
حسب: Dunne, Anthony
منشور في: (2005)

Parts selection and management
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A designer's guide to built-in self-test
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منشور في: (2002)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
منشور في: (2012)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
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Microelectronic failure analysis desk reference : 2001 supplement /
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Microelectronic failure analysis desk reference.
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