Failure analysis a practical guide for manufacturers of electronic components and systems /

Novel architectures for flexible electrochemical devices and systems
著者:: Kawahara, Jun
出版事項: (2013)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
著者:: Karris, Steven T.
出版事項: (2012)

Boundary-scan interconnect diagnosis
著者:: Sousa, José T. de
出版事項: (2001)

Polymers for electronic components a Rapra industry analysis report /
著者:: Cousins, Keith
出版事項: (2001)

Hertzian tales electronic products, aesthetic experience, and critical design /
著者:: Dunne, Anthony
出版事項: (2005)

High temperature electronics design for aero engine controls and health monitoring /
著者:: Stoica, Lucian, 等
出版事項: (2016)

Electronic devices : a text and software problems manual /
著者:: Schultz, Mitchel E.
出版事項: (1994)

Designing the internet of things /
著者:: McEwen, Adrian
出版事項: (2014)

Cost analysis of electronic systems
著者:: Sandborn, Peter
出版事項: (2013)

A designer's guide to built-in self-test
著者:: Stroud, Charles E.
出版事項: (2002)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
出版事項: (1996)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
出版事項: (2002)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
出版事項: (2000)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
出版事項: (1999)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
出版事項: (1998)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
出版事項: (2004)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
出版事項: (2001)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
出版事項: (2003)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
出版事項: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
出版事項: (1997)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
出版事項: (2008)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
出版事項: (2012)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
出版事項: (2010)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
出版事項: (2011)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
出版事項: (2007)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
出版事項: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
出版事項: (2014)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
出版事項: (2009)

Solid state electronic devices /
著者:: Streetman, Ben G.
出版事項: (2010)

Introduction to microfabrication
著者:: Franssila, Sami
出版事項: (2010)

Design for at-speed test, diagnosis, and measurement
出版事項: (2000)

Electronic : devices and circuits /
著者:: Kulshreshtha, D. c.
出版事項: (2006)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
出版事項: (2015)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
出版事項: (2006)

Electronic materials science
著者:: Irene, Eugene A.
出版事項: (2005)

Digital rubbish natural history of electronics /
著者:: Gabrys, Jennifer
出版事項: (2011)