Íomhá chlúdaigh

Cód QR

Reliability technology principles and practice of failure prevention in electronic systems /

Sábháilte in:

Sonraí bibleagrafaíochta
Príomhchruthaitheoir:	Pascoe, Norman
Údar corparáideach:	ebrary, Inc
Formáid:	Leictreonach Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	Chichester, West Sussex, U.K. : Wiley, 2011.
Sraith:	Wiley series in quality and reliability engineering.
Ábhair:	Electronic apparatus and appliances > Reliability. System failures (Engineering) > Prevention. Electronic books.
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

Míreanna comhchosúla

Failure analysis a practical guide for manufacturers of electronic components and systems /
de réir: Bâzu, M. I. (Marius I.), 1948-
Foilsithe / Cruthaithe: (2011)

Parts selection and management
Foilsithe / Cruthaithe: (2004)

Guide to state-of-the-art electron devices
Foilsithe / Cruthaithe: (2013)

Electronic components and processes
de réir: Maheshwari, Preeti
Foilsithe / Cruthaithe: (2006)

Novel architectures for flexible electrochemical devices and systems
de réir: Kawahara, Jun
Foilsithe / Cruthaithe: (2013)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
de réir: Karris, Steven T.
Foilsithe / Cruthaithe: (2012)

Hertzian tales electronic products, aesthetic experience, and critical design /
de réir: Dunne, Anthony
Foilsithe / Cruthaithe: (2005)

High temperature electronics design for aero engine controls and health monitoring /
de réir: Stoica, Lucian, et al.
Foilsithe / Cruthaithe: (2016)

Electronic devices : a text and software problems manual /
de réir: Schultz, Mitchel E.
Foilsithe / Cruthaithe: (1994)

Polymers for electronic components a Rapra industry analysis report /
de réir: Cousins, Keith
Foilsithe / Cruthaithe: (2001)

Designing the internet of things /
de réir: McEwen, Adrian
Foilsithe / Cruthaithe: (2014)

Boundary-scan interconnect diagnosis
de réir: Sousa, José T. de
Foilsithe / Cruthaithe: (2001)

Lead-free solder interconnect reliability
Foilsithe / Cruthaithe: (2005)

Spacecraft reliability and multi-state failures a statistical approach /
de réir: Saleh, Joseph H., 1971-
Foilsithe / Cruthaithe: (2011)

Solid state electronic devices /
de réir: Streetman, Ben G.
Foilsithe / Cruthaithe: (2010)

Construction reliability safety, variability and sustainability /
Foilsithe / Cruthaithe: (2011)

Cost analysis of electronic systems
de réir: Sandborn, Peter
Foilsithe / Cruthaithe: (2013)

Electronic : devices and circuits /
de réir: Kulshreshtha, D. c.
Foilsithe / Cruthaithe: (2006)

Electronic materials science
de réir: Irene, Eugene A.
Foilsithe / Cruthaithe: (2005)

Introduction to microfabrication
de réir: Franssila, Sami
Foilsithe / Cruthaithe: (2010)

Digital rubbish natural history of electronics /
de réir: Gabrys, Jennifer
Foilsithe / Cruthaithe: (2011)

Polymers for electricity and electronics materials, properties, and applications /
de réir: Drobny, Jiri George
Foilsithe / Cruthaithe: (2012)

Terrestrial radiation effects in ULSI devices and electronic systems /
de réir: Ibe, Eishi H.
Foilsithe / Cruthaithe: (2015)

A designer's guide to built-in self-test
de réir: Stroud, Charles E.
Foilsithe / Cruthaithe: (2002)

High tech trash digital devices, hidden toxics, and human health /
de réir: Grossman, Elizabeth, 1957-
Foilsithe / Cruthaithe: (2006)

ESD basics from semiconductor manufacturing to use /
de réir: Voldman, Steven H.
Foilsithe / Cruthaithe: (2012)

Materials for high-density electronic packaging and interconnection report of the Committee on Materials for High-Density Electronic Packaging, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council.
Foilsithe / Cruthaithe: (1990)

System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthday /
Foilsithe / Cruthaithe: (2001)

Electrical characterization of organic electronic materials and devices
de réir: Stallinga, Peter, 1966-
Foilsithe / Cruthaithe: (2009)

Systems reliability and failure prevention
de réir: Hecht, Herbert
Foilsithe / Cruthaithe: (2004)

Single-electron devices and circuits in silicon
de réir: Durrani, Zahid Ali Khan
Foilsithe / Cruthaithe: (2010)

Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging
Foilsithe / Cruthaithe: (2006)

Electrical engineering materials
de réir: Basak, T. K.
Foilsithe / Cruthaithe: (2012)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Foilsithe / Cruthaithe: (1996)

Technology for facility managers the impact of cutting-edge technology on facility management /
Foilsithe / Cruthaithe: (2012)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Foilsithe / Cruthaithe: (2002)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Foilsithe / Cruthaithe: (2000)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Foilsithe / Cruthaithe: (1999)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Foilsithe / Cruthaithe: (1998)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Foilsithe / Cruthaithe: (2004)