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Electromigration in ULSI interconnections

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Detalhes bibliográficos
Autor principal:	Tan, Cher Ming, 1959-
Autor Corporativo:	ebrary, Inc
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	Hackensack, N.J. : World Scientific, c2010.
Colecção:	International series on advances in solid state electronics and technology.
Assuntos:	Integrated circuits > Ultra large scale integration. Electrodiffusion. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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