Electromigration in ULSI interconnections
में बचाया:
मुख्य लेखक: | Tan, Cher Ming, 1959- |
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निगमित लेखक: | ebrary, Inc |
स्वरूप: | इलेक्ट्रोनिक ई-पुस्तक |
भाषा: | अंग्रेज़ी |
प्रकाशित: |
Hackensack, N.J. :
World Scientific,
c2010.
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श्रृंखला: | International series on advances in solid state electronics and technology.
|
विषय: | |
ऑनलाइन पहुंच: | An electronic book accessible through the World Wide Web; click to view |
टैग: |
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