Electromigration in ULSI interconnections
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Main Author: | Tan, Cher Ming, 1959- |
---|---|
Corporate Author: | ebrary, Inc |
Format: | Electronic eBook |
Language: | English |
Published: |
Hackensack, N.J. :
World Scientific,
c2010.
|
Series: | International series on advances in solid state electronics and technology.
|
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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