ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
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Korporace: | International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc |
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Médium: | Elektronický zdroj Konferenční příspěvek E-kniha |
Jazyk: | angličtina |
Vydáno: |
Materials Park, Ohio :
ASM International,
2003.
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On-line přístup: | An electronic book accessible through the World Wide Web; click to view |
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Electronic materials science
Autor: Irene, Eugene A.
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Podobné jednotky
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