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Transient-induced latchup in CMOS integrated circuits

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Detalhes bibliográficos
Autor principal:	Ker, Ming-Dou
Autor Corporativo:	ebrary, Inc
Outros Autores:	Hsu, Sheng-Fu
Formato:	Recurso Eletrônico livro eletrônico
Idioma:	inglês
Publicado em:	Singapore ; Hoboken, NJ : Wiley, c2009.
Assuntos:	Metal oxide semiconductors, Complementary > Defects. Metal oxide semiconductors, Complementary > Reliability. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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